• DocumentCode
    3643839
  • Title

    VLSI low loss interconnects scattering parameters

  • Author

    Agnieszka Wardzińska;Wojciech Bandurski

  • Author_Institution
    Poznan University of Technology, Chair of Multimedia Telecommunication and Microelectronics, Poland
  • fYear
    2011
  • Firstpage
    516
  • Lastpage
    519
  • Abstract
    The scattering parameters can be powerful description of interconnect parameters. In the paper we present the closed form formulas for the scattering parameters for low loss interconnect. The method bases on multiple scales method and expands the voltage and current in series of losses parameter. The first order approximation calculate the lossless line response. The impact of losses is included in constants of solution of differential equation. The proposed formulas for scattering parameters are compared with exact calculations in frequency domain.
  • Keywords
    "Scattering parameters","Integrated circuit interconnections","Load modeling","Power transmission lines","Frequency domain analysis","Integrated circuit modeling","Time domain analysis"
  • Publisher
    ieee
  • Conference_Titel
    Circuit Theory and Design (ECCTD), 2011 20th European Conference on
  • Print_ISBN
    978-1-4577-0617-2
  • Type

    conf

  • DOI
    10.1109/ECCTD.2011.6043402
  • Filename
    6043402