DocumentCode
3643992
Title
A Framework to Manage Knowledge from Defect Resolution Process
Author
Gregory Claude;Marc Boyer;Gaël Durand;Florence Sèdes
Author_Institution
IRIT, Univ. de Toulouse, Toulouse, France
fYear
2011
Firstpage
10
Lastpage
17
Abstract
This paper presents a framework for the management, the processing and the reuse, of information relative to defects. This framework is based on the fact that each defect triggers a resolution process in which information about the detected incident (i.e. the problem) and about the applied protocol to resolve it (i.e. the solution) is collected. These different types of information are the cornerstone of the optimization of corrective and preventive processes for new defects. Experimentations show that our prototype provides a very satisfactory quality of results with good performances.
Keywords
"Maintenance engineering","Prototypes","Manufacturing processes","Databases","Context","Software"
Publisher
ieee
Conference_Titel
Commerce and Enterprise Computing (CEC), 2011 IEEE 13th Conference on
Print_ISBN
978-1-4577-1542-6
Type
conf
DOI
10.1109/CEC.2011.11
Filename
6046949
Link To Document