• DocumentCode
    3644156
  • Title

    Phase evolution of solder alloys

  • Author

    Alena Pietriková;Juraj Ďurišin

  • Author_Institution
    Department of Technologies in Electronics, Faculty of Electrical Engineering and Informatics, Technical University of Koš
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    299
  • Lastpage
    302
  • Abstract
    In-situ X-ray diffraction (XRD) measurements applying synchrotron radiation were realized to evaluate microstructure evolution of 95.5Sn3.8Ag0.7Cu (wt. %), 99Sn1Cu (wt. %) and 96Sn4Ag (wt. %) lead-free solder alloys during heating (30-250°C), isothermal annealing (250°C) and cooling (250-30°C). The extra accent was focused on the study of melting and solidification process, clearing up formation, distribution and the order of crystallization of the crystal phases (β-Sn, intermetallic compounds) in the selected solder alloys.
  • Keywords
    "Temperature measurement","X-ray diffraction","Diffraction","Soldering","Cooling","Lead"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2011 34th International Spring Seminar on
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4577-2111-3
  • Electronic_ISBN
    2161-2536
  • Type

    conf

  • DOI
    10.1109/ISSE.2011.6053877
  • Filename
    6053877
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3644156