• DocumentCode
    3644326
  • Title

    A stochastic wire length distribution for gigascale integration (GSI)

  • Author

    J.A. Davis;V.K. De;J.D. Meindl

  • Author_Institution
    Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1997
  • Firstpage
    145
  • Lastpage
    150
  • Abstract
    Based on Rent´s Rule, a well established empirical relationship, a rigorous derivation of a complete wire length distribution for on-chip random logic networks is performed. This distribution is used to enhance a critical path model; to derive a preliminary dynamic power dissipation model; and to describe optimal architectures for multilevel wiring networks that provide maximum interconnect density.
  • Keywords
    "Stochastic processes","Wire","Integrated circuit interconnections","Distribution functions","Wiring","Probability density function","Microprocessors","Logic","Power system modeling","Power dissipation"
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
  • Print_ISBN
    0-7803-3669-0
  • Type

    conf

  • DOI
    10.1109/CICC.1997.606603
  • Filename
    606603