DocumentCode :
3644326
Title :
A stochastic wire length distribution for gigascale integration (GSI)
Author :
J.A. Davis;V.K. De;J.D. Meindl
Author_Institution :
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1997
Firstpage :
145
Lastpage :
150
Abstract :
Based on Rent´s Rule, a well established empirical relationship, a rigorous derivation of a complete wire length distribution for on-chip random logic networks is performed. This distribution is used to enhance a critical path model; to derive a preliminary dynamic power dissipation model; and to describe optimal architectures for multilevel wiring networks that provide maximum interconnect density.
Keywords :
"Stochastic processes","Wire","Integrated circuit interconnections","Distribution functions","Wiring","Probability density function","Microprocessors","Logic","Power system modeling","Power dissipation"
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
Print_ISBN :
0-7803-3669-0
Type :
conf
DOI :
10.1109/CICC.1997.606603
Filename :
606603
Link To Document :
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