• DocumentCode
    3644754
  • Title

    Extraction of jitter parameters from BER measurements

  • Author

    Marko Aleksić

  • Author_Institution
    Rambus Inc., 1050 Enterprise Way, Suite 700, Sunnyvale, CA 94089, USA
  • fYear
    2011
  • Firstpage
    63
  • Lastpage
    66
  • Abstract
    This paper presents a method for jitter parameter extraction from bit error rate measurements, that can be used as an alternative to the dual-Dirac method. The method offers more accurate estimates of random and deterministic jitter, at the expense of a slight increase in complexity. The model underlying the method can be used for extrapolation of bit error rate to the values that are impractical to measure.
  • Keywords
    "Jitter","Bit error rate","Approximation methods","Fitting","Parameter extraction","Accuracy","Data mining"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-9398-2
  • Type

    conf

  • DOI
    10.1109/EPEPS.2011.6100187
  • Filename
    6100187
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3644754