Title :
Extraction of jitter parameters from BER measurements
Author_Institution :
Rambus Inc., 1050 Enterprise Way, Suite 700, Sunnyvale, CA 94089, USA
Abstract :
This paper presents a method for jitter parameter extraction from bit error rate measurements, that can be used as an alternative to the dual-Dirac method. The method offers more accurate estimates of random and deterministic jitter, at the expense of a slight increase in complexity. The model underlying the method can be used for extrapolation of bit error rate to the values that are impractical to measure.
Keywords :
"Jitter","Bit error rate","Approximation methods","Fitting","Parameter extraction","Accuracy","Data mining"
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
Print_ISBN :
978-1-4244-9398-2
DOI :
10.1109/EPEPS.2011.6100187
