• DocumentCode
    3644817
  • Title

    Accelerated ageing tests for predicting capacitor lifetimes

  • Author

    Rajmond Jánó;Dan Pitică

  • Author_Institution
    Applied Electronics Department, Technical University of Cluj-Napoca, Cluj-Napoca, Romania
  • fYear
    2011
  • Firstpage
    63
  • Lastpage
    68
  • Abstract
    Being reliability critical components, and widely used in electronics today, electrolytic aluminum capacitors are one of the most likely components to fail under extreme working conditions. Therefore in safety critical applications, their lifetime prediction is of vital importance. The following paper analyses current prediction algorithms and offers an improved solution for capacitor lifetime prediction. The results are obtained from accelerated ageing tests and theoretical data obtained from calculi are compared to real world data obtained from measurements.
  • Keywords
    "Capacitors","Prediction algorithms","Capacitance","Accelerated aging","Life estimation","Reliability"
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
  • Print_ISBN
    978-1-4577-1276-0
  • Type

    conf

  • DOI
    10.1109/SIITME.2011.6102687
  • Filename
    6102687