DocumentCode
3644817
Title
Accelerated ageing tests for predicting capacitor lifetimes
Author
Rajmond Jánó;Dan Pitică
Author_Institution
Applied Electronics Department, Technical University of Cluj-Napoca, Cluj-Napoca, Romania
fYear
2011
Firstpage
63
Lastpage
68
Abstract
Being reliability critical components, and widely used in electronics today, electrolytic aluminum capacitors are one of the most likely components to fail under extreme working conditions. Therefore in safety critical applications, their lifetime prediction is of vital importance. The following paper analyses current prediction algorithms and offers an improved solution for capacitor lifetime prediction. The results are obtained from accelerated ageing tests and theoretical data obtained from calculi are compared to real world data obtained from measurements.
Keywords
"Capacitors","Prediction algorithms","Capacitance","Accelerated aging","Life estimation","Reliability"
Publisher
ieee
Conference_Titel
Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
Print_ISBN
978-1-4577-1276-0
Type
conf
DOI
10.1109/SIITME.2011.6102687
Filename
6102687
Link To Document