DocumentCode :
3644817
Title :
Accelerated ageing tests for predicting capacitor lifetimes
Author :
Rajmond Jánó;Dan Pitică
Author_Institution :
Applied Electronics Department, Technical University of Cluj-Napoca, Cluj-Napoca, Romania
fYear :
2011
Firstpage :
63
Lastpage :
68
Abstract :
Being reliability critical components, and widely used in electronics today, electrolytic aluminum capacitors are one of the most likely components to fail under extreme working conditions. Therefore in safety critical applications, their lifetime prediction is of vital importance. The following paper analyses current prediction algorithms and offers an improved solution for capacitor lifetime prediction. The results are obtained from accelerated ageing tests and theoretical data obtained from calculi are compared to real world data obtained from measurements.
Keywords :
"Capacitors","Prediction algorithms","Capacitance","Accelerated aging","Life estimation","Reliability"
Publisher :
ieee
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
Print_ISBN :
978-1-4577-1276-0
Type :
conf
DOI :
10.1109/SIITME.2011.6102687
Filename :
6102687
Link To Document :
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