Analytical modeling of Single Event Transients propagation in combinational logic gates

We present a Single Event Transient (SET) propagation model that can be used to categorize the propagation likelihood of a given noise waveform trough a logic gate. This analysis is key to predict if a SET induced within a combinational block is capable of causing a SEU. The model predicts the output noise characteristics given the input noise waveform for each gate, and is applied to a 65-nm technology library. These noise transfer curves have a relatively simple analytical expression suitable for an easy adoption within CAD tools. Comparison between simulations and model show a good agreement for a commercial 65 nm technology.