DocumentCode
3645398
Title
Discussion group summary for IIRW 2011
Author
Jim Lloyd
fYear
2011
Firstpage
154
Lastpage
155
Abstract
Three topics that were discussed are summarized: Reliability simulations, TDDB and NBTI.
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
ISSN
1930-8841
Print_ISBN
978-1-4577-0113-9
Type
conf
DOI
10.1109/IIRW.2011.6142613
Filename
6142613
Link To Document