DocumentCode :
3645398
Title :
Discussion group summary for IIRW 2011
Author :
Jim Lloyd
fYear :
2011
Firstpage :
154
Lastpage :
155
Abstract :
Three topics that were discussed are summarized: Reliability simulations, TDDB and NBTI.
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
ISSN :
1930-8841
Print_ISBN :
978-1-4577-0113-9
Type :
conf
DOI :
10.1109/IIRW.2011.6142613
Filename :
6142613
Link To Document :
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