DocumentCode
3646144
Title
Reflection ellipsometry with a polarimetric multistatic array for short range imaging applications
Author
Amir Ćenanović;Frank Gumbmann;Lorenz-Peter Schmidt
Author_Institution
Microwave Engineering and High Frequency Technology (LHFT), University of Erlangen-Nuremberg, Cauerstr. 9, 91058, Germany
fYear
2011
Firstpage
598
Lastpage
601
Abstract
This paper presents an approach for the detection of dielectric layers on human bodies and the determination of their dielectric constant with single frequency measurement data in the W-band (75-110 GHz). The measurements were performed with a polarimetric multistatic array, which was optimized for short range applications. The scattering matrix of each resolution element was analyzed via the reflection ellipsometry method, adopted from optics. For millimeter wave imaging techniques, used in the field of nondestructive testing (NDT) and for security applications, this measurement approach offers an promising alternative to the time domain analysis, which requires broadband data.
Keywords
"Permittivity","Frequency measurement","Dielectrics","Arrays","Permittivity measurement","Imaging"
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Print_ISBN
978-1-4577-2034-5
Type
conf
Filename
6173821
Link To Document