• DocumentCode
    3646144
  • Title

    Reflection ellipsometry with a polarimetric multistatic array for short range imaging applications

  • Author

    Amir Ćenanović;Frank Gumbmann;Lorenz-Peter Schmidt

  • Author_Institution
    Microwave Engineering and High Frequency Technology (LHFT), University of Erlangen-Nuremberg, Cauerstr. 9, 91058, Germany
  • fYear
    2011
  • Firstpage
    598
  • Lastpage
    601
  • Abstract
    This paper presents an approach for the detection of dielectric layers on human bodies and the determination of their dielectric constant with single frequency measurement data in the W-band (75-110 GHz). The measurements were performed with a polarimetric multistatic array, which was optimized for short range applications. The scattering matrix of each resolution element was analyzed via the reflection ellipsometry method, adopted from optics. For millimeter wave imaging techniques, used in the field of nondestructive testing (NDT) and for security applications, this measurement approach offers an promising alternative to the time domain analysis, which requires broadband data.
  • Keywords
    "Permittivity","Frequency measurement","Dielectrics","Arrays","Permittivity measurement","Imaging"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
  • Print_ISBN
    978-1-4577-2034-5
  • Type

    conf

  • Filename
    6173821