DocumentCode :
3646225
Title :
Characterization of dielectric materials using partially loaded waveguide measurements
Author :
Emre Kiliç;Uwe Siart;Carsten H. Schmidt;Thomas F. Eibert
Author_Institution :
Lehrstuhl fü
fYear :
2012
fDate :
3/1/2012 12:00:00 AM
Firstpage :
1
Lastpage :
3
Abstract :
In this study, an iterative inversion algorithm for the determination of complex dielectric permittivity of non-magnetic, isotropic materials is presented. The dielectric sample to be measured is considered to load a rectangular waveguide partially. The inversion method is based on a fit between simulated and measured scattering parameters by Newton´s technique. In order to obtain the simulated scattering parameters, a 3-D electromagnetic field solver is used to perform full-wave simulation of the problem under consideration. For validation of the proposed technique, estimated complex dielectric permittivities of three different materials at K-band are presented.
Keywords :
"Permittivity","Transmission line measurements","Materials","Permittivity measurement","Temperature measurement","Electromagnetic waveguides"
Publisher :
ieee
Conference_Titel :
Microwave Conference (GeMiC), 2012 The 7th German
ISSN :
2167-8022
Print_ISBN :
978-1-4577-2096-3
Type :
conf
Filename :
6185158
Link To Document :
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