• DocumentCode
    3646255
  • Title

    Awards

  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    1
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4673-1110-6
  • Type

    conf

  • DOI
    10.1109/STHERM.2012.6188812
  • Filename
    6188812