• DocumentCode
    3647015
  • Title

    Low noise as a diagnostic tool for GaSb based laser diodes prepared by Molecular Beam Epitaxy

  • Author

    M. Luňák;Z. Chobola;J. Vaněk;E. Hulicius

  • Author_Institution
    Stavební
  • fYear
    2012
  • fDate
    5/1/2012 12:00:00 AM
  • Firstpage
    343
  • Lastpage
    346
  • Abstract
    Transport and noise characteristics of forward biased semiconductor lasers diodes GaSb based VCSE (Vertical Cavity Surface Emitting) laser were prepared by MBE (Molecular Beam Epitaxy) were measured in order to evaluate the new MBE technology.
  • Keywords
    "Noise","Resistance","Diode lasers","Vertical cavity surface emitting lasers","Junctions"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics (MIEL), 2012 28th International Conference on
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-0237-1
  • Type

    conf

  • DOI
    10.1109/MIEL.2012.6222870
  • Filename
    6222870
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3647015