DocumentCode
3647213
Title
Fractal structures for low-resistance large area AlGaN/GaN power transistors
Author
R. Reiner;P. Waltereit;F. Benkhelifa;S. Muller;S. Müller;H. Walcher;S. Wagner;R. Quay;M. Schlechtweg;O. Ambacher
Author_Institution
Fraunhofer Inst. for Appl. Solid State Phys., IAF, Freiburg, Germany
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
341
Lastpage
344
Abstract
This work introduces a new design approach for the use of fractal structures for low-resistance large area transistors structures. Aspects of layout with adapted current density and high-area utilization are considered. Furthermore the work presents a realization of fractal structures in AlGaN/GaN technology. Both static and dynamic behaviors are characterized. The fabricated devices achieve a breakdown voltage of VBR >; 700V and on-state currents of ID = 40A at VGS = 1V.
Keywords
"Logic gates","Fractals","Metallization","Fingers","Transistors","Resistance","Gallium nitride"
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on
ISSN
1943-653X
Print_ISBN
978-1-4577-1594-5
Electronic_ISBN
1946-0201
Type
conf
DOI
10.1109/ISPSD.2012.6229091
Filename
6229091
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