• DocumentCode
    3647213
  • Title

    Fractal structures for low-resistance large area AlGaN/GaN power transistors

  • Author

    R. Reiner;P. Waltereit;F. Benkhelifa;S. Muller;S. Müller;H. Walcher;S. Wagner;R. Quay;M. Schlechtweg;O. Ambacher

  • Author_Institution
    Fraunhofer Inst. for Appl. Solid State Phys., IAF, Freiburg, Germany
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    341
  • Lastpage
    344
  • Abstract
    This work introduces a new design approach for the use of fractal structures for low-resistance large area transistors structures. Aspects of layout with adapted current density and high-area utilization are considered. Furthermore the work presents a realization of fractal structures in AlGaN/GaN technology. Both static and dynamic behaviors are characterized. The fabricated devices achieve a breakdown voltage of VBR >; 700V and on-state currents of ID = 40A at VGS = 1V.
  • Keywords
    "Logic gates","Fractals","Metallization","Fingers","Transistors","Resistance","Gallium nitride"
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4577-1594-5
  • Electronic_ISBN
    1946-0201
  • Type

    conf

  • DOI
    10.1109/ISPSD.2012.6229091
  • Filename
    6229091