• DocumentCode
    3647604
  • Title

    2012 IRPS panel sessions and workshops [two abstracts]

  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Provides abstracts for the following panels: "System Approach to Reliability" and "GaN Power Device Reliability - Opportunities and Challenges." A full record of the panel discussions was not made available for publication as part of the conference proceedings.
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2012 IEEE International
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4577-1678-2
  • Electronic_ISBN
    1938-1891
  • Type

    conf

  • DOI
    10.1109/IRPS.2012.6241765
  • Filename
    6241765