Structural and compositional surface inhomogeneities of laser annealed Hg/sub 1-x/Cd/sub x/Te estimated by Raman spectroscopy

We have investigated the behavior of Hg/sub 1-x/Cd/sub x/Te (x=0.165) wafer under pulsed laser irradiation in air. Raman spectroscopy has been used to characterize the chemical, compositional, morphological, and order-disorder changes produced by the laser irradiation. This paper presents the results related to structural and compositional surface inhomogeneities of the laser annealed Hg/sub 1-x/Cd/sub x/Te obtained by Raman spectroscopy.