DocumentCode :
3648182
Title :
Fabrication and characterization of p-NiO/n-ZnO heterojunction towards transparent diode
Author :
J. Grochowski;M. Guziewicz;R. Kruszka;M. Borysiewicz;K. Kopałko;A. Piotrowska
Author_Institution :
Institute of Electron Technology, Warsaw, Poland
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
488
Lastpage :
491
Abstract :
The aim of our work was to produce p-n heterojunction with the high level of optical transmission. P-type NiO and n-type ZnO:Al films deposited by magnetron sputtering were used to fabricate p-n diodes. These were thermally processed in Ar ambient at 400°C in order to obtain high optical transmission and better electrical characteristics. The best diode´s parameters were rectifying ratio of 6.7·104 and reverse current at the level of 6·10-7A at -3 V of bias. The best obtained optical transmission of the bilayer was near 20% in the visual wavelength region.
Keywords :
"Zinc oxide","Optical device fabrication","Optical films","Heterojunctions","Argon","Semiconductor diodes"
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2012 35th International Spring Seminar on
ISSN :
2161-2528
Print_ISBN :
978-1-4673-2241-6
Electronic_ISBN :
2161-2536
Type :
conf
DOI :
10.1109/ISSE.2012.6273152
Filename :
6273152
Link To Document :
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