Title :
Testable design of digital ASIC with embedded analog multiplexers
Author :
S. Jankovic;D. Maksimovic;P. Petkovic;V. Litovski
Author_Institution :
Fac. of Electron. Eng., Nis Univ., Serbia
Abstract :
This paper describes the design of a digital ASIC (Application Specific Integrated Circuit) with embedded analog multiplexers. The circuit is designed for a power-meter device. Additional circuitry is introduced to provide testability of both the digital and analog parts. After the design phase, the chip is fabricated and tested.
Keywords :
"Application specific integrated circuits","Multiplexing","Switches","Circuit testing","Macrocell networks","Counting circuits","Integrated circuit packaging","Silicon","Design automation","Integrated circuit interconnections"
Conference_Titel :
Microelectronics, 1997. Proceedings., 1997 21st International Conference on
Print_ISBN :
0-7803-3664-X
DOI :
10.1109/ICMEL.1997.632961
