• DocumentCode
    3649288
  • Title

    Application of time-to-failure distributions for the modelling of ageing processes

  • Author

    Romuald Włodek

  • Author_Institution
    Rzeszow Univ. of Technology, Dept. of Power Electronic and Power Engineering, Poland
  • fYear
    2012
  • Firstpage
    532
  • Lastpage
    535
  • Abstract
    Ageing process of an insulation system appears in the final part of failure rate function v. exploitation time and it influences then the reliability of the device in this time interval of exploitation. Paper presents the different types of the time-to-failure distribution functions and their effects on the failure rate functions.
  • Keywords
    "Reliability","Aging","Shape","Distribution functions","Weibull distribution","Cable insulation"
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2012 International Conference on
  • Print_ISBN
    978-1-4673-4747-1
  • Type

    conf

  • DOI
    10.1109/ICHVE.2012.6357089
  • Filename
    6357089
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3649288