• DocumentCode
    3649395
  • Title

    Simulation of optimization of NMOS structures channel areas technological processes

  • Author

    V. Kašauskas;R. Anilionis

  • Author_Institution
    Department of Electronics Engineering, Kaunas University of Technology, Studentų
  • fYear
    2012
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    NMOS transistor structures are widely used in IC´s. Many manufacturing processes and operations are used in the production process. It is important to choose and deliver technological process (TP) parameters necessary for production for IC design. In this case, the problem addressed is redistribution of structures after a number of TP. So, the optimization of technological manufacturing processes of NMOS structures, and hence the channel area, is important. High-temperature TP (oxidation, diffusion, etc.) have been examined in previous works [4,9]. This paper will focus in the optimization of the channel formation by way of ion implantation (II). A variety of simulations are used for the optimization in the design phase. In this paper, the simulation is performed using ATHENA software package. It is also important to choose and propose the algorithms for optimization of technological processes. This paper offers an optimization algorithm for choosing the modes of II.
  • Keywords
    "Optimization","MOS devices","Production","Algorithm design and analysis","Mathematical model","Ion implantation","Impurities"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Conference (BEC), 2012 13th Biennial Baltic
  • ISSN
    1736-3705
  • Print_ISBN
    978-1-4673-2775-6
  • Type

    conf

  • DOI
    10.1109/BEC.2012.6376810
  • Filename
    6376810