• DocumentCode
    3650296
  • Title

    [Copyright notice]

  • fYear
    2013
  • fDate
    3/1/2013 12:00:00 AM
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4673-6427-0
  • Type

    conf

  • DOI
    10.1109/SEMI-THERM.2013.6526791
  • Filename
    6526791