DocumentCode :
3650296
Title :
[Copyright notice]
fYear :
2013
fDate :
3/1/2013 12:00:00 AM
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE
ISSN :
1065-2221
Print_ISBN :
978-1-4673-6427-0
Type :
conf
DOI :
10.1109/SEMI-THERM.2013.6526791
Filename :
6526791
Link To Document :
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