• DocumentCode
    3650339
  • Title

    Acknowledgments

  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    VTS, like any complex organization, is the result of the efforts of a large number of volunteers, who selflessly have volunteered their time and energy, with their only reward being the satisfaction of seeing a job well done, and the consciousness to have contributed to the dissemination of scientific knowledge through the continued success of a forum dedicated to the exchange of advances in both research and practice in VLSI Test. No words would compare to the magnitude of the efforts displayed by these volunteers. However, we would nonetheless like to register herein our personal note of thanks to the whole body of volunteers, who made it possible the organization of VTS 2013.
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2013 IEEE 31st
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-5542-1
  • Type

    conf

  • DOI
    10.1109/VTS.2013.6548876
  • Filename
    6548876