Title : 
Characterization and modeling of zero bias rf-detection diodes based on triple barrier resonant tunneling structures
         
        
            Author : 
Gregor Keller;Anselme Tchegho;Benjamin Münstermann;Werner Prost;Franz-Josef Tegude;Michihiko Suhara
         
        
            Author_Institution : 
Center for Semiconductor Technology and Optoelectronics, University of Duisburg Essen, Lotharstr. 55, D-47057, Germany
         
        
        
        
        
            Abstract : 
InP-based resonant tunneling diodes with symmetrical I/V-characteristics have shown their excellent high frequency performance for THz signal generation. For signal detection we present a device with an additional third barrier to create an unsymmetrical I/V-characteristic. Sensitivity measurements are performed and further improvements by scaling of the active device area are discussed. To allow SPICE based circuit simulation an approach for a large signal model is presented.
         
        
            Keywords : 
"Mathematical model","Sensitivity","Resonant tunneling devices","Semiconductor diodes","Semiconductor device measurement","Voltage measurement","Temperature measurement"
         
        
        
            Conference_Titel : 
Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
         
        
        
            Print_ISBN : 
978-1-4673-6130-9
         
        
        
            DOI : 
10.1109/ICIPRM.2013.6562641