DocumentCode :
3650396
Title :
Characterization and modeling of zero bias rf-detection diodes based on triple barrier resonant tunneling structures
Author :
Gregor Keller;Anselme Tchegho;Benjamin Münstermann;Werner Prost;Franz-Josef Tegude;Michihiko Suhara
Author_Institution :
Center for Semiconductor Technology and Optoelectronics, University of Duisburg Essen, Lotharstr. 55, D-47057, Germany
fYear :
2013
Firstpage :
1
Lastpage :
2
Abstract :
InP-based resonant tunneling diodes with symmetrical I/V-characteristics have shown their excellent high frequency performance for THz signal generation. For signal detection we present a device with an additional third barrier to create an unsymmetrical I/V-characteristic. Sensitivity measurements are performed and further improvements by scaling of the active device area are discussed. To allow SPICE based circuit simulation an approach for a large signal model is presented.
Keywords :
"Mathematical model","Sensitivity","Resonant tunneling devices","Semiconductor diodes","Semiconductor device measurement","Voltage measurement","Temperature measurement"
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
ISSN :
1092-8669
Print_ISBN :
978-1-4673-6130-9
Type :
conf
DOI :
10.1109/ICIPRM.2013.6562641
Filename :
6562641
Link To Document :
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