مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3650975

Title :

Process and testing innovations

fYear :

2013

Firstpage :

221

Lastpage :

222

Keywords :

"Educational institutions","High K dielectric materials","Electrical engineering","Computers","Business","Testing","Technological innovation"

Publisher :

ieee

Conference_Titel :

Device Research Conference (DRC), 2013 71st Annual

ISSN :

1548-3770

Print_ISBN :

978-1-4799-0811-0

Type :

conf

DOI :

10.1109/DRC.2013.6633873

Filename :

6633873

Link To Document :