DocumentCode :
3651109
Title :
EMC compliant LIN transceiver
Author :
Philipp Schröter;Magnus-Maria Hell;Martin Frey
Author_Institution :
Automotive, Infineon Technol., Neubiberg, Germany
fYear :
2013
Firstpage :
363
Lastpage :
366
Abstract :
This paper introduces an integrated Local Interconnect Network (LIN) transceiver which sets a new performance benchmark in terms of electromagnetic compatibility (EMC). The proposed topology succeeds in an extraordinary high robustness against RF disturbances which are injected into the BUS and in very low electromagnetic emissions (EMEs) radiated by the LIN network without adding any external components for filtering. In order to evaluate the circuits superior EMC performance, it was designed using a HV-BiCMOS technology for automotive applications, the EMC behavior was measured and the results were compared with a state of the art topology.
Keywords :
"Radio frequency","Logic gates","Transceivers","Automotive engineering","Electromagnetics","Immunity testing"
Publisher :
ieee
Conference_Titel :
ESSCIRC (ESSCIRC), 2013 Proceedings of the
ISSN :
1930-8833
Print_ISBN :
978-1-4799-0643-7
Type :
conf
DOI :
10.1109/ESSCIRC.2013.6649148
Filename :
6649148
Link To Document :
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