Title :
Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp.
Author :
John Bird;Rob Davies;David DuVal;Forrest Gasdia;Charlie Hamp;Richard Horton;Tim Koval;Jennifer Lee;Kristin Marino;Timothy O´Connor;Sana Rezgui; Dakai Chen;Megan C. Casey;Hak S. Kim;Anthony M. Phan
Author_Institution :
Ball Aerosp. &
fDate :
7/1/2013 12:00:00 AM
Abstract :
A number of electronic devices have been tested for sensitivity to single event effects for space applications by Ball Aerospace & Technologies Corp. and collaborators. Test conditions and results are presented for each device.
Keywords :
"Transient analysis","Performance evaluation","Limiting","Sensitivity","Aerospace testing","Ions"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658190
