DocumentCode :
3651885
Title :
A low noise and low loss power MOSFET with low Vth regions for voltage regulators
Author :
Masahiro Masunaga;Takayuki Hashimoto;Kouichi Kato;Hiroki Andou;Hideo Numabe;Zen Tomizawa;Nobuyoshi Matsuura
Author_Institution :
Hitachi Res. Lab., Hitachi Ltd., Hitachi, Japan
fYear :
2013
fDate :
5/1/2013 12:00:00 AM
Firstpage :
91
Lastpage :
94
Abstract :
A novel low voltage power MOSFET with a low threshold voltage (Vth) region (sub-MOS) is proposed. The proposed MOSFET has a superior trade-off relationship between output efficiency and switching noise, with a spike voltage 82% lower than a conventional MOSFET and the same efficiency at 300 kHz with an output current of 20 A. Since the proposed device reduces the drain current through rate (dir/dt) by false turn-on of the sub-MOS, it decreases the spike voltage during diode reverse recovery. The false turn-on losses are suppressed by the saturation current of the sub-MOS, which is controlled by optimizing the sub-MOS area and the Vth. The low on-state resistance of sub-MOS compensates for the false turn-on losses to achieve high efficiency.
Keywords :
"MOSFET","Logic gates","Schottky diodes","Voltage control","Regulators","Threshold voltage","Resistance"
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
ISSN :
1943-653X
Print_ISBN :
978-1-4673-5134-8
Type :
conf
DOI :
10.1109/ISPSD.2013.6694404
Filename :
6694404
Link To Document :
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