DocumentCode
3652198
Title
Two-Dinlensional Numerical Modeling of Interband Tunneling Accounting for Nonuniform Electric Field
Author
P. Habas;A. Lugbauer;S. Selberherr
Author_Institution
Institute for Microelectronics, Gusshausstrasse
fYear
1992
fDate
6/14/1905 12:00:00 AM
Firstpage
135
Lastpage
140
Keywords
"Numerical models","Tunneling","Nonuniform electric fields","MOSFETs","Degradation","Microelectronics","Hot carriers","Geometry","Semiconductor process modeling","Photonic band gap"
Publisher
ieee
Conference_Titel
Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on
Print_ISBN
0-7803-0516-7
Type
conf
DOI
10.1109/NUPAD.1992.674093
Filename
674093
Link To Document