• DocumentCode
    3652198
  • Title

    Two-Dinlensional Numerical Modeling of Interband Tunneling Accounting for Nonuniform Electric Field

  • Author

    P. Habas;A. Lugbauer;S. Selberherr

  • Author_Institution
    Institute for Microelectronics, Gusshausstrasse
  • fYear
    1992
  • fDate
    6/14/1905 12:00:00 AM
  • Firstpage
    135
  • Lastpage
    140
  • Keywords
    "Numerical models","Tunneling","Nonuniform electric fields","MOSFETs","Degradation","Microelectronics","Hot carriers","Geometry","Semiconductor process modeling","Photonic band gap"
  • Publisher
    ieee
  • Conference_Titel
    Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on
  • Print_ISBN
    0-7803-0516-7
  • Type

    conf

  • DOI
    10.1109/NUPAD.1992.674093
  • Filename
    674093