Title :
Diagnosis of digital/analogue measurement system with application of test bus and distributed diagnostic subsystem
Author :
K. Badzmirowski;M. Gonera;J. Kern
Author_Institution :
Ind. Inst. of Electron., Warszawa, Poland
Abstract :
The article describes a method of diagnosis applied to the digital/analogue distributed measurement systems, based on a diagnostic subsystem with the distributed multilayer structure of hardware and software. The solution described, enables one to join independence of the diagnostic subsystem and possibility of using the diagnosed distributed measurement system resources, both of the equipment (JTAG diagnostic bus) and of the software (e.g. standard software modules working in the WINDOWS environment). To find limitations of IEEE 1149 Test Bus standard for parametric faults monitoring, we measured and presented some characteristics of the Programmable Acquisition Modules, including P1149.4 test chip. The developed Diagnostic Subsystem described herein, thanks to the flexible structure and universality of modules, interfaces and programming software, enables development of the additional virtual aids, adapted to needs of the particular applications.
Keywords :
"Application software","Software measurement","Semiconductor device measurement","Measurement standards","Testing","Nonhomogeneous media","Hardware","Software standards","Condition monitoring","Flexible structures"
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679834