DocumentCode :
3652997
Title :
Enhanced Parametric Estimation Of Electroencephalograms Under Acceleration Stress
Author :
F. Yarman-Vural;B. Onaral;E. Cetin
Author_Institution :
Drexel University
fYear :
1990
fDate :
6/12/1905 12:00:00 AM
Firstpage :
837
Lastpage :
839
Keywords :
"Acceleration","Stress","Electroencephalography","Brain modeling","Noise measurement","Lab-on-a-chip","Pollution measurement","Additive white noise","Density measurement","Biomedical monitoring"
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1990., Proceedings of the Twelfth Annual International Conference of the IEEE
Print_ISBN :
0-87942-559-8
Type :
conf
DOI :
10.1109/IEMBS.1990.691425
Filename :
691425
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3652997
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