DocumentCode
3653418
Title
Suitability of COTS IBM 64M DRAM in space
Author
A.J. Fox;W.E. Abare;A. Ross
Author_Institution
Naval Res. Lab., Washington, DC, USA
fYear
1997
Firstpage
240
Lastpage
244
Abstract
This paper provides results of total dose and heavy ion testing of the IBM 0165400 DRAM, and discusses the architectural impacts of using these parts in a solid state digital recorder in a LEO orbit.
Keywords
"Random access memory","USA Councils","System testing","Aerospace testing","Solid state circuits","Low earth orbit satellites","Error correction","Radiation detector circuits","Temperature","Laboratories"
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Print_ISBN
0-7803-4071-X
Type
conf
DOI
10.1109/RADECS.1997.698899
Filename
698899
Link To Document