Title :
Suitability of COTS IBM 64M DRAM in space
Author :
A.J. Fox;W.E. Abare;A. Ross
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
This paper provides results of total dose and heavy ion testing of the IBM 0165400 DRAM, and discusses the architectural impacts of using these parts in a solid state digital recorder in a LEO orbit.
Keywords :
"Random access memory","USA Councils","System testing","Aerospace testing","Solid state circuits","Low earth orbit satellites","Error correction","Radiation detector circuits","Temperature","Laboratories"
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Print_ISBN :
0-7803-4071-X
DOI :
10.1109/RADECS.1997.698899
