DocumentCode :
3655668
Title :
[Title page]
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Abstract :
The following topics are dealt with: logic technology; reliability; 3D systems and packaging; advanced CMOS technology: Ge FinFET; memory technology; PC RAM; contact-interconnect; ReRAM; nanowire FET; Si FinFET; magnetic tunnel junction; X-on insulator; 3D NAND Flash & other NVM; non-Si substrates: and III-V HEMT-FET-TFET.
Publisher :
ieee
Conference_Titel :
VLSI Technology (VLSI Technology), 2015 Symposium on
ISSN :
0743-1562
Electronic_ISBN :
2158-9682
Type :
conf
DOI :
10.1109/VLSIT.2015.7223621
Filename :
7223621
Link To Document :
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