Analysis Of Collector Signal Delay In Bipolar Devices Using A Monte Carlo Method
Author :
Y. Tsuboi;C. Fiegna;E. Sangiorgi;B. Ricc;T. Wada;Y. Katsumata;H. Iwai
Author_Institution :
Toshiba Corporation
fYear :
1993
fDate :
6/15/1905 12:00:00 AM
Firstpage :
98
Lastpage :
99
Keywords :
"Signal analysis","Delay estimation","Electrons","Delay effects","Ultra large scale integration","Research and development","Doping","Degradation","Inspection","Impurities"
Publisher :
ieee
Conference_Titel :
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
