DocumentCode :
3659197
Title :
Challenges of 3D VLSI-CoolCubeTM process with p-Ge-OI and n-InGaAs-OI for ultimate CMOS nodes
Author :
F. Nemouchi;L. Hutin;H. Boutry;P. Rodriguez;E. Ghegin;J. Borrel;Y. Morand;S. Kerdiles;P. Batude;M. Vinet
Author_Institution :
CEA, Leti, Minatec Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 - France
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, we evaluate the various technological solutions and roadblocks for co-integrating p-Ge and n-InGaAs MOSFETs in a 3-D monolithic CoolCubeTM technology. In particular, the process sequence (Ge-p-MOS-1st or III-V-n-MOS-1st) is examined in the light of thermal budget limitations arising from junctions definition.
Keywords :
"Junctions","Indium gallium arsenide","Three-dimensional displays","Epitaxial growth","Doping","Plasma temperature","Silicon"
Publisher :
ieee
Conference_Titel :
Silicon Nanoelectronics Workshop (SNW), 2015
Type :
conf
Filename :
7275332
Link To Document :
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