Title :
Prediction of electronic parameters of compensated multi-crystalline solar-grade silicon using artificial neural networks
Author :
Jagdish C. Patra;Chiara Modanese;Maurizio Acciarri
Author_Institution :
Faculty of Science, Engineering and Technology, Swinburne University of Technology, Melbourne, Australia
fDate :
7/1/2015 12:00:00 AM
Abstract :
Because of economic and energy-consumption considerations, multicrystalline solar grade silicon (mc-SoG-Si), instead of expensive electronic-grade Si, is being considered in photovoltaic (PV) industry for production of solar modules. These materials usually contain a comparable amount of acceptors (e.g., Boron) and donors (e.g., Phosphorus) and are therefore called compensated mc-SoG-Si. The three main electronic parameters, e.g., majority carrier mobility (μ), majority carrier density (p) and resistivity (ρ), of compensated mc-SoG-Si vary nonlinearly with temperature due to several complex mechanisms. In this paper, we propose two artificial neural network (ANN)-based models to predict these electronic parameters of mc-SoG-Si material. Using a limited amount of measurement data, we have shown that the first ANN-based model can predict the three electronic parameters of a given sample without accounting for the compensation ratio over a wide temperature range of 70-400 K. Whereas, the second ANN model can predict these electronic parameters of a given sample with unknown compensation ratio over the same temperature range. With extensive simulation results we have shown that these models can predict the three parameters with a maximum error of ±10%.
Keywords :
"Temperature measurement","Energy measurement","Measurement uncertainty","Scattering","Crystallization","Standards","Oxygen"
Conference_Titel :
Neural Networks (IJCNN), 2015 International Joint Conference on
Electronic_ISBN :
2161-4407
DOI :
10.1109/IJCNN.2015.7280426