• DocumentCode
    3662565
  • Title

    A low-power temperature-compensated relaxation oscillator for built-in test signal generation

  • Author

    Li Xu;Marvin Onabajo

  • Author_Institution
    Dept. of Electrical and Computer Engineering, Northeastern University, Boston, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An on-chip frequency reference for built-in testing and calibration applications is presented. The design combines a proportional-to-absolute-temperature (PTAT) current reference and a relaxation oscillator core. A temperature compensation scheme is realized based on the thermal voltage, for which simulations indicate low sensitivity to process variations. The oscillator was designed and simulated in a 130nm CMOS process with a power supply of 1.2V. It generates a 40KHz output and occupies a layout area of 0.025mm2. A temperature coefficient of 101ppm/°C is achieved over the range from -30°C to 85°C. The simulated phase noise is -90dBc/Hz at 10KHz offset.
  • Keywords
    "Oscillators","Capacitors","Timing","Temperature dependence","Resistors","Transistors","Mathematical model"
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2015 IEEE 58th International Midwest Symposium on
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2015.7282022
  • Filename
    7282022
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3662565