DocumentCode :
3662628
Title :
Supervised facial recognition based on eigenanalysis of multiresolution and independent features
Author :
Ahmed Aldhahab;George Atia;Wasfy B. Mikhael
Author_Institution :
Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, USA
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a supervised facial recognition system is presented. In the feature extraction step, a Two Dimensional Discrete Multiwavelet Transform (2D DMWT) is used to extract useful information from the face images. The 2D DMWT is followed by a Two-Dimensional Fast Independent Component Analysis (2D FastICA) and eigendecomposition to obtain discriminating and independent features. The resulting compressed features are fed into a Neural Network (NNT) based classifier for training and testing. All techniques are tested using ORL, YALE, and FERET databases. The proposed approach shows a significant improvement in the recognition rate, storage requirements, as well as computational complexity.
Keywords :
"Feature extraction","Databases","Face recognition","Transforms","Eigenvalues and eigenfunctions","Multiresolution analysis","Training"
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2015 IEEE 58th International Midwest Symposium on
Type :
conf
DOI :
10.1109/MWSCAS.2015.7282087
Filename :
7282087
Link To Document :
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