• DocumentCode
    3662628
  • Title

    Supervised facial recognition based on eigenanalysis of multiresolution and independent features

  • Author

    Ahmed Aldhahab;George Atia;Wasfy B. Mikhael

  • Author_Institution
    Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a supervised facial recognition system is presented. In the feature extraction step, a Two Dimensional Discrete Multiwavelet Transform (2D DMWT) is used to extract useful information from the face images. The 2D DMWT is followed by a Two-Dimensional Fast Independent Component Analysis (2D FastICA) and eigendecomposition to obtain discriminating and independent features. The resulting compressed features are fed into a Neural Network (NNT) based classifier for training and testing. All techniques are tested using ORL, YALE, and FERET databases. The proposed approach shows a significant improvement in the recognition rate, storage requirements, as well as computational complexity.
  • Keywords
    "Feature extraction","Databases","Face recognition","Transforms","Eigenvalues and eigenfunctions","Multiresolution analysis","Training"
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2015 IEEE 58th International Midwest Symposium on
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2015.7282087
  • Filename
    7282087