Title :
Write process modeling in MLC flash memories using renewal theory
Author :
Meysam Asadi;Erich F. Haratsch;Aleksander Kavcic;Narayana P. Santhanam
Author_Institution :
Department of Electrical Engineering, University of Hawaii at Manoa, Honolulu, HI
fDate :
6/1/2015 12:00:00 AM
Abstract :
In the write process of multilevel per cell (MLC) flash memories, an iterative approach is used to mitigate the monotonicity problem. The monotonicity in programming is considered to be the major restriction in MLC flash. In this paper, we are mostly concerned with deriving a mathematical model for iterative programming using the framework of “renewal processes”. Then, we approximate the maximum number of steps in iterative programming, and obtain the voltage distribution in flash due to iterative programming. Moreover, the obtained results help us to accurately analyze the effect of inter-cell interference (ICI) in this type of memory. Finally, we obtain a more precise voltage distribution for the symbol states in flash memory. Simulation results show the effect of varying the step size in the iterative programming and the effect of ICI on the information rate.
Keywords :
"Ash","Programming","Threshold voltage","Information rates","Mathematical model","Detectors","Interference"
Conference_Titel :
Information Theory (ISIT), 2015 IEEE International Symposium on
Electronic_ISBN :
2157-8117
DOI :
10.1109/ISIT.2015.7282535