• DocumentCode
    3664712
  • Title

    TSV-based PUF circuit for 3DIC sensor nodes in IoT applications

  • Author

    Chao Wang;Jun Zhou;Katti Guruprasad;Xin Liu;Roshan Weerasekera;Tony T. Kim

  • Author_Institution
    Institute of Microelectronics, A∗
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    313
  • Lastpage
    316
  • Abstract
    Sensor nodes massively deployed in Internet of Things are subject to physical capture, hardware tampering, device cloning, and unauthorized device alteration. This paper presented a novel ring oscillator PUF (Physical Unclonable Function) circuit exploiting the process variation of both CMOS devices and TSVs (Through Silicon Vias) available on TSV-based 3D stacking sensor nodes, for secure data generation resistant to physical attacks. As far as we know from the literature, this is the first work on TSV-based 3D PUF circuits. Simulation results based on a 0.18-μm CMOS technology and a 5.2-μm via-last TSV technology show that the proposed 3D PUF circuit has stronger uniqueness and reproducibility in PUF behavior.
  • Keywords
    "Conferences","Electron devices","Solid state circuits"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
  • Print_ISBN
    978-1-4799-8362-9
  • Type

    conf

  • DOI
    10.1109/EDSSC.2015.7285113
  • Filename
    7285113