DocumentCode
3664712
Title
TSV-based PUF circuit for 3DIC sensor nodes in IoT applications
Author
Chao Wang;Jun Zhou;Katti Guruprasad;Xin Liu;Roshan Weerasekera;Tony T. Kim
Author_Institution
Institute of Microelectronics, A∗
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
313
Lastpage
316
Abstract
Sensor nodes massively deployed in Internet of Things are subject to physical capture, hardware tampering, device cloning, and unauthorized device alteration. This paper presented a novel ring oscillator PUF (Physical Unclonable Function) circuit exploiting the process variation of both CMOS devices and TSVs (Through Silicon Vias) available on TSV-based 3D stacking sensor nodes, for secure data generation resistant to physical attacks. As far as we know from the literature, this is the first work on TSV-based 3D PUF circuits. Simulation results based on a 0.18-μm CMOS technology and a 5.2-μm via-last TSV technology show that the proposed 3D PUF circuit has stronger uniqueness and reproducibility in PUF behavior.
Keywords
"Conferences","Electron devices","Solid state circuits"
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN
978-1-4799-8362-9
Type
conf
DOI
10.1109/EDSSC.2015.7285113
Filename
7285113
Link To Document