DocumentCode :
3664714
Title :
Temperature modeling of fully-printed OTFTs based on a modified A-Si: H TFT model
Author :
M. A. Sankhare;E. Bergeret;P. Pannier;R. Coppard
Author_Institution :
IMT-Technopole de Chateau-Gombert, IM2NP, Marseille, France
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
321
Lastpage :
324
Abstract :
This work focuses on modeling low-cost fully-printed OTFTs (Organic Thin Film Transistors). The OTFTs were made on a flexible Polyethylene Naphtalate substrate and used Polytriarylamine and Acene-based diimide for P- and N-Type organic semiconductors respectively. Extraction methods associated with the original A-Si: H TFT (Amorphous-Silicon: Hydrogenated Thin Film Transistors) model were applied to the OTFTs at temperatures ranging from 25°C to 100°C. Due to the A-Si: H TFT model parameters´ dependence on temperature, which makes it inappropriate for the presented OTFTs, a modified model is proposed based on their specific parameter dependences. This tailored model matched well when tested with basic organic circuits.
Keywords :
"Organic thin film transistors","Integrated circuit modeling","Temperature dependence","Temperature measurement","Geometry","Temperature"
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-8362-9
Type :
conf
DOI :
10.1109/EDSSC.2015.7285115
Filename :
7285115
Link To Document :
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