Title :
Study on cell shape in 3D NAND flash memory
Author :
Wei Feng;Nine Deng
Author_Institution :
Institute of Microelectronics, Tsinghua University, Beijing, China, 100084
fDate :
6/1/2015 12:00:00 AM
Abstract :
All kinds of cell structures are appeared in 3D NAND flash technologies and all seem to be promising. In this paper, detail comparisons among the cell structures of them are presented. The theoretical derivation and simulation results both support that the cylindrical cell structure has better program/erase speed and memory window.
Keywords :
"Conferences","Electron devices","Solid state circuits"
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-8362-9
DOI :
10.1109/EDSSC.2015.7285132