DocumentCode :
3664824
Title :
Effect of stress on a bimorph piezoelectric micromachined ultrasound transducer
Author :
Marvin Tan Xing Haw;Liang Lou;Yuandong Alex Gu
Author_Institution :
Institute of Microelectronics, Agency for Science, Technology and Research (A∗
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
752
Lastpage :
755
Abstract :
A bimorph piezoelectric micromachined ultrasound transducer (pMUT) is presented. The bimorph comprises molybdenum and aluminum nitride (AlN) layers in both the top and bottom sections of the device. Residual stresses were included in both the top and bottom sections of the simulation model. Simulation results show that a progression from compressive to tensile stress leads to an increase in the fundamental resonant frequency of the pMUT. Deriving inspiration from Stoney´s equation, a mathematical model is proposed to extract the value of the residual stresses from the experimental data. The residual stresses obtained agree well with the hypothesized inverse relationship between the radius of curvature and the stress difference between the top and bottom sections of the pMUT.
Keywords :
"Conferences","Electron devices","Solid state circuits"
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-8362-9
Type :
conf
DOI :
10.1109/EDSSC.2015.7285226
Filename :
7285226
Link To Document :
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