Title :
An input buffer with monolithic JFET in standard BCD technology for sensor applications
Author :
Klaus Y. J. Hsu;Tsu-Wei Chuang
Author_Institution :
Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan
fDate :
6/1/2015 12:00:00 AM
Abstract :
A new input buffer with monolithic integrated JFET in standard BCD technologies is presented in this work. The JFET has been implemented without any modification to the standard BCD process. An input buffer with PMOSFET was also fabricated for comparison. Measurements showed that the low-frequency input referred noise of the JFET input buffer is much smaller than that of the PMOSFET buffer. The proposed circuit can be applied to low-noise front-end amplifiers of sensors.
Keywords :
"JFETs","MOSFET circuits","Noise","MOSFET","Standards","Logic gates","Noise measurement"
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-8362-9
DOI :
10.1109/EDSSC.2015.7285235
