DocumentCode :
3664894
Title :
An improved K-means clustering algorithm for sleep stages classification
Author :
Xiao Shuyuan;Wang Bei;Zhang Jian;Zhang Qunfeng;Zou Junzhong;Masatoshi Nakamura
Author_Institution :
Department of Automation, School of Information Science and Engineering, East China University of Science and Technology, Shanghai, China
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
1222
Lastpage :
1227
Abstract :
Sleep stage scoring is used to evaluate one´s overnight sleep process, which is important for clinical diagnosis. However, the visual inspection of sleep data is a laborious task and the scoring results may be subjective to different clinicians. The purpose of this paper is to develop an automatic sleep stage classification algorithm to reduce the artificial workload. The overnight sleep data are represented by the extracted features from time domain and frequency domain of EEG. An improved k-means clustering algorithm is proposed to classify overnight sleep data into five stages including awake (W), NREM (Non-Rapid Eye Movement) stage 1 (S1), NREM stage 2 (S2), slow-wave sleep (SS) and REM (Rapid Eye Movement). In the improved k-means clustering algorithm, the points with dense surrounding are selected as the original centers by using the concept of density for reference. Additionally, the cluster centers are updated according to `Three-Sigma Rule´ during the iteration. The determination of cluster center selection was developed which can be adaptive to the actual cases and abate the singular points effect. The obtained results showed that the accuracy of proposed algorithm was satisfied; especially it can distinguish W, SS and REM effectively. Furthermore, the improved k-means algorithm had less number of misclassification and higher accuracy than the original algorithm.
Keywords :
"Sleep","Clustering algorithms","Electroencephalography","Classification algorithms","Electrooculography","Feature extraction","Electromyography"
Publisher :
ieee
Conference_Titel :
Society of Instrument and Control Engineers of Japan (SICE), 2015 54th Annual Conference of the
Type :
conf
DOI :
10.1109/SICE.2015.7285326
Filename :
7285326
Link To Document :
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