• DocumentCode
    3665013
  • Title

    Emissivity-free thermal imaging with dual-wavelength reflectance-ratio method

  • Author

    Yu Yamaguchi;Yoshiro Yamada

  • Author_Institution
    National Metrology Institute of Japan, AIST, Tsukuba, Japan
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    116
  • Lastpage
    119
  • Abstract
    Dual-wavelength reflectance-ratio (DWR) technique is extended to thermal imaging. Compared to the spot DWR, signals from two-dimensionally arrayed detectors need a lot of calculation processing, but the method makes it easy to understand actual temperature distribution and has widely applicable fields. In this presentation, principle of DWR, measurement setup and results are shown.
  • Keywords
    "Temperature measurement","Wavelength measurement","Temperature distribution","Reflectivity","Imaging","Surface waves","Optical surface waves"
  • Publisher
    ieee
  • Conference_Titel
    Society of Instrument and Control Engineers of Japan (SICE), 2015 54th Annual Conference of the
  • Type

    conf

  • DOI
    10.1109/SICE.2015.7285446
  • Filename
    7285446
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3665013