Title :
Emissivity-free thermal imaging with dual-wavelength reflectance-ratio method
Author :
Yu Yamaguchi;Yoshiro Yamada
Author_Institution :
National Metrology Institute of Japan, AIST, Tsukuba, Japan
fDate :
7/1/2015 12:00:00 AM
Abstract :
Dual-wavelength reflectance-ratio (DWR) technique is extended to thermal imaging. Compared to the spot DWR, signals from two-dimensionally arrayed detectors need a lot of calculation processing, but the method makes it easy to understand actual temperature distribution and has widely applicable fields. In this presentation, principle of DWR, measurement setup and results are shown.
Keywords :
"Temperature measurement","Wavelength measurement","Temperature distribution","Reflectivity","Imaging","Surface waves","Optical surface waves"
Conference_Titel :
Society of Instrument and Control Engineers of Japan (SICE), 2015 54th Annual Conference of the
DOI :
10.1109/SICE.2015.7285446
