DocumentCode :
3666445
Title :
Evaluating effects of constant and pulsed current in pulse initiated systems
Author :
Andrea M. Martinez;Daniel P. Muffoletto;Kevin M. Burke;Jennifer L. Zirnheld
Author_Institution :
Energy Systems Integration, Department of Electrical Engineering, University at Buffalo, 230 Davis Hall, Buffalo, NY 14260
fYear :
2014
fDate :
6/1/2014 12:00:00 AM
Firstpage :
380
Lastpage :
383
Abstract :
Fuses are designed to protect electrical systems from atypical characteristic events like overcurrent impulses. Most fuses are one shot devices, as the protection of the other circuit components come from the breaking of the sacrificial device, therefore nuisance failures present a problem. Transient currents can cause unforeseen stress to electrical devices, including pulse initiated systems, which can lead to malfunctions, damage and even permanent failure of the system. In order to quantify the detrimental effects transient currents can have on pulse initiated systems this research will test fuses under both constant and pulsing signals of different amplitudes. Upon completion, any changes in the fuse´s average opening times will be evaluated to determine if there were any quantifiable effects that have contributed to the aging process.
Keywords :
"Fuses","Weibull distribution","Voltage measurement","Resistance","Current measurement","Transient analysis","Oscilloscopes"
Publisher :
ieee
Conference_Titel :
Power Modulator and High Voltage Conference (IPMHVC), 2014 IEEE International
Print_ISBN :
978-1-4673-7323-4
Type :
conf
DOI :
10.1109/IPMHVC.2014.7287289
Filename :
7287289
Link To Document :
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