• DocumentCode
    3666445
  • Title

    Evaluating effects of constant and pulsed current in pulse initiated systems

  • Author

    Andrea M. Martinez;Daniel P. Muffoletto;Kevin M. Burke;Jennifer L. Zirnheld

  • Author_Institution
    Energy Systems Integration, Department of Electrical Engineering, University at Buffalo, 230 Davis Hall, Buffalo, NY 14260
  • fYear
    2014
  • fDate
    6/1/2014 12:00:00 AM
  • Firstpage
    380
  • Lastpage
    383
  • Abstract
    Fuses are designed to protect electrical systems from atypical characteristic events like overcurrent impulses. Most fuses are one shot devices, as the protection of the other circuit components come from the breaking of the sacrificial device, therefore nuisance failures present a problem. Transient currents can cause unforeseen stress to electrical devices, including pulse initiated systems, which can lead to malfunctions, damage and even permanent failure of the system. In order to quantify the detrimental effects transient currents can have on pulse initiated systems this research will test fuses under both constant and pulsing signals of different amplitudes. Upon completion, any changes in the fuse´s average opening times will be evaluated to determine if there were any quantifiable effects that have contributed to the aging process.
  • Keywords
    "Fuses","Weibull distribution","Voltage measurement","Resistance","Current measurement","Transient analysis","Oscilloscopes"
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator and High Voltage Conference (IPMHVC), 2014 IEEE International
  • Print_ISBN
    978-1-4673-7323-4
  • Type

    conf

  • DOI
    10.1109/IPMHVC.2014.7287289
  • Filename
    7287289