Title :
Study on the clamp diodes of grid-emitter influencing the active voltage balancing of series connected IGBTs
Author :
XuZhe Xu;YaoHong Sun
Author_Institution :
Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing 100190, China
fDate :
6/1/2014 12:00:00 AM
Abstract :
This paper presents the clamp diodes in gate driving circuit significantly influenced the transient balancing of series-connected IGBTs. By the method of Monte Carlo and vary simulation analysis, slight differences of a plurality of IGBTs in the transient voltage balancing can be accumulated in a particular IGBT. More IGBTs, this case was more serious. The differences of voltage-clamp generally accounted for five percent, but the voltage differences emerged by 48 IGBTs in series were more than four times. Through the in-depth analysis, the diode clamp voltage difference would cause the gate turn-off delay differences. This is one of the key factors occurred the dynamic voltage imbalance.
Keywords :
"Insulated gate bipolar transistors","Monte Carlo methods","Transient analysis","Discharges (electric)","Logic gates","Resistors","Clamps"
Conference_Titel :
Power Modulator and High Voltage Conference (IPMHVC), 2014 IEEE International
Print_ISBN :
978-1-4673-7323-4
DOI :
10.1109/IPMHVC.2014.7287363