• DocumentCode
    3667135
  • Title

    Low-frequency noise in organic transistors

  • Author

    Ognian Marinov;M. Jamal Deen

  • Author_Institution
    Department of Electrical and Computer Engineering, McMaster University, 1280 Main Street West, Hamilton, ON, L8S 4K1 Canada
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, we build on our previous work that introduced variable range hopping (VRH) as a plausible origin of flicker or low-frequency noise (LFN) in organic thin film transistors (OTFTs). While LFN is important in OTFTs, other issues with low mobility and contact effects are also active research and development efforts in the field. Since several LFN models have been proposed for OTFTs, then we compare and discuss the merits of each model. Specifically, we discuss models based on the Hooge equation, trapping (flat-band number fluctuation), VRH (conduction fluctuation) and the most recent layer-separation theory.
  • Keywords
    "Fluctuations","Organic thin film transistors","Mathematical model","Low-frequency noise"
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2015 International Conference on
  • Type

    conf

  • DOI
    10.1109/ICNF.2015.7288547
  • Filename
    7288547
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3667135