• DocumentCode
    3667144
  • Title

    High sensitivity noise measurements: Circuits, techniques and applications

  • Author

    Giorgio Ferrari;Marco Carminati;Giacomo Gervasoni;Marco Sampietro;Enrico Prati;Cecilia Pennetta;Francesca Lezzi;Dario Pisignano

  • Author_Institution
    Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Noise measurements on high quality devices can be hampered by the unavoidable noise added by the instrument performing the measurement. The paper will briefly discuss the reduction of the instrumental noise achievable by the cross-correlation technique and by the design of custom CMOS amplifiers. Practical applications in the case of nanofiber organic field-effect-transistors and of cryogenic noise measurements are also commented.
  • Keywords
    "Noise","Noise measurement","Instruments","CMOS integrated circuits","Transistors","Current measurement","Correlation"
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2015 International Conference on
  • Type

    conf

  • DOI
    10.1109/ICNF.2015.7288556
  • Filename
    7288556
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3667144