• DocumentCode
    3667190
  • Title

    Simulation of shot noise measurement experiments in graphene

  • Author

    P. Marconcini;M. Macucci

  • Author_Institution
    Dipartimento di Ingegneria dell´Informazione, Università
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We have adopted an approximate technique for the determination of the potential landscape and an envelope-function based transport calculation to simulate the shot noise properties, in the presence of potential disorder, of a graphene constriction biased through lateral split gates. Our numerical results are in good qualitative agreement with the measurements recently performed by A. Mostovov and D. C. Glattli on this structure, which show a dependence of the Fano factor on the gate bias, with a maximum around the Dirac point.
  • Keywords
    "Graphene","Noise","Logic gates","Electric potential","Noise measurement","Voltage measurement","Capacitance"
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2015 International Conference on
  • Type

    conf

  • DOI
    10.1109/ICNF.2015.7288602
  • Filename
    7288602