Title :
Application of OMEMS technology in trapped ion quantum computing
Author :
Stephen Crain;Emily Mount;So-Young Baek;Jungsang Kim;Peter Maunz
Author_Institution :
Fitzpatrick Institute for Photonics, Electrical and Computer Engineering Department, Duke University, Durham, North Carolina 27708, USA
Abstract :
Scalability is one of the main challenges of trapped ion based quantum computation, partly limited by the ability to manipulate the increasing number of quantum bits (qubits). For individual addressing of qubits, microelectromechanical systems (MEMS) technology allows one to design movable micromirrors to focus laser beams on individual ions and steer the focal point in two dimensions. This system is able to scale to multiple beams, has switching speeds comparable to typical single qubit gate times, and has negligible crosstalk on neighboring ions.
Keywords :
"Switches","Charge carrier processes","Optics"
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2015 International Conference on
Print_ISBN :
978-1-4673-6834-6
Electronic_ISBN :
2160-5041
DOI :
10.1109/OMN.2015.7288890